Peter Meer received the Dipl. Engn. degree from the Bucharest Polytechnic Institute, Romania in 1971, and the D.Sc. degree from the Technion, Israel Institute of Technology, Haifa, in 1986, both in electrical engineering. From 1971 to 1979 he was with the Computer Research Institute, Cluj, Romania, working on R&D of digital hardware. Between 1986 and 1990 he was Assistant Research Scientist at the Center for Automation Research, University of Maryland at College Park. In 1991 he joined the Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ and is currently a Professor. He has held visiting appointments in Japan, Korea, Sweden, Israel and France, and was on the organizing committees of numerous international workshops and conferences. He was an Associate Editor of the IEEE Transaction on Pattern Analysis and Machine Intelligence between 1998 and 2002, was a Guest Editor of Computer Vision and Image Understanding for a special issue on robustness in computer vision in 2000, and was a member of the Editorial Board of Pattern Recognition between 1989 and 2005. He is coauthor of an award winning paper in Pattern Recognition in 1989, the best student paper in 1999, the best paper in 2000 and the runner-up paper in 2007 in the IEEE Conference on Computer Vision and Pattern Recognition (CVPR). With coautors Dorin Comaniciu and Visvanathan Ramesh he received at the 2010 CVPR the Longuet-Higgins prize for fundamental contributions in computer vision in the past ten years. His research interest is in application of modern statistical methods to image understanding problems. He is an IEEE Fellow.
Professor of Electrical and Computer Engineering, Rutgers University